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| 论文题目: | self-healing behaviors of metallized high-temperature dielectric films for capacitor applications |
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| 作者: | jiafeng zhu, hui tong*, shimo cao, jinpeng luo, xuepeng liu, ju xu, moliar oleksandr, wenfei peng* |
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| 刊物名称: | microelectronics reliability |
| 年: | 2023 |
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self-healing behaviors of metallized high-temperature dielectric films for capacitor applications