developing an accelerated life test method for led source and failure analysis-k8kaifa

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developing an accelerated life test method for led source and failure analysis
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论文题目: developing an accelerated life test method for led source and failure analysis
论文题目英文:
作者: chen gong;haiping xu;jinhua liang;zengquan yuan;xi chen;haoyan li
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刊物名称: aopc 2022: optoelectronics and nanophotonics
: 2023
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